Research

Applied ML that met real data

Four peer-reviewed papers across EEG diagnostics, smartphone sensor fusion, medical screening, and manufacturing inspection.

Publications

Selected work

December 2, 2025IEEE INDISCON 2025

From Brain Signals to Diagnosis: A Joint Learning Approach for ADHD Detection

A deep learning approach to ADHD detection from preprocessed EEG signals, evaluating six joint CNN, LSTM, and GRU architectures for accurate, data-driven diagnosis.

Conference paper · IEEE

Devrajsinh Jhala, Pranav Sirodaria, Yogesh Kumar, Poonam Bhargav

Best accuracy
99.93%
Architectures
6
Band-pass range
4-40 Hz
ADHD DetectionEEGDeep LearningCNN-LSTM
View research99.93%
December 1, 2024ICPR 2024

Smart Phone Sensor Data Fusion: A Joint Learning Approach to Activity Recognition

A deep learning system for smartphone-based human activity recognition using accelerometer and gyroscope data, comparing a Full Transformer model with a proposed Joint Learning fusion architecture.

Conference paper · Springer Nature

Devraj Jhala, Bhargav Nadiadra, Chintan M. Bhatt, Alessandro Bruno, Salvatore Sorce

Best accuracy
98%
Best F1 score
98%
Dataset
UCI-HAR
Human Activity RecognitionSensor FusionCNN-LSTMTransformers
View research98%
July 4, 2024ICNGCIS 2023

Early Prediction of Down Syndrome Using Deep Transfer Learning-Based Approaches

A transfer learning study for early Down Syndrome screening from facial images using multiple pre-trained CNN architectures and targeted fine-tuning.

Book chapter · Taylor & Francis

Nirmit Patel, Tarang Ghetia, Devraj Jhala, Shubh Kapadia, Yogesh Kumar

Dataset size
~3,000 images
Best model
Xception
Split
75 / 25
Deep LearningTransfer LearningMedical ImagingCNN
View research~3,000 images
July 11, 2024FLUTE 2023

Non-contact Inspection of Electrically Discharged Materials Using Machine Learning

A machine learning approach for predicting surface roughness in EDM-machined materials using process parameters instead of contact-based inspection.

Conference paper · Springer Nature

Devrajsinh Jhala, Nirmit Patel, Jemil Dharia, Jemin Butani, Devesh Patel, M. B. Kiran

Best model
KNN
R2 score
~0.999
Augmented samples
9,300
Machine LearningManufacturingEDMRegression
View researchKNN